FEI Strata 235 Dual Beam

FEI Strata 235 Dual Beam

The FEI Strata 235 DualBeam integrates a field emission SEM with a FIB. The SEM unit is equipped with detectors for secondary electron imaging. The ion column uses a Ga liquid ion metal source (LMIS) and a two-lens focusing column for bombarding the target material with a focused ion-beam for material removal or deposition. The instrument is also equipped with a Gas Injection System (GIS) for deposition of Pt or W and an Omniprobe for TEM thin foil extraction, through the lift out technique.
The instrument can be booked here. For more information, please contact Head of Laboratory Anders Kvist or Research Engineer Stefan Gustafsson.

Instrument data:

FIB
 - Ga ion source
 - Operating voltage: 30 kV
  (with additional options at 5 and 10 kV)
 - Currents: 1 pA – 20 nA
 
SEM
 - Field emission gun
 - Operating voltage: 1-30 kV

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